JEDEC JEP163A 2023 SELECTION OF BURN-IN / LIFE TEST CONDITIONS AND CRITICAL PARAMETERS FOR QML MICROCIRCUITS

JEDEC JEP163A 2023

Title :	SELECTION OF BURN-IN / LIFE TEST CONDITIONS AND CRITICAL PARAMETERS FOR QML MICROCIRCUITS
Organization :	JEDEC
Document Number :	JEP163A
Document Type :	PDF
Keywords :	-
Publication Date :	2023
Number Of Page :	0
Language :	English
Description :	-
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